1) The document presents a method for accelerating circuit testing and fault detection using an Arduino Nano-based logic gate integrated circuit tester.
2) The tester uses an Arduino Nano microcontroller to process inputs and outputs of logic gates and display results on an LCD. It can test ICs with 14 pins.
3) The research aims to design hardware and software for the tester to efficiently test and identify faults in logic gates, making circuit testing more accessible.
1) The document presents a method for accelerating circuit testing and fault detection using an Arduino Nano-based logic gate integrated circuit tester.
2) The tester uses an Arduino Nano microcontroller to process inputs and outputs of logic gates and display results on an LCD. It can test ICs with 14 pins.
3) The research aims to design hardware and software for the tester to efficiently test and identify faults in logic gates, making circuit testing more accessible.
1) The document presents a method for accelerating circuit testing and fault detection using an Arduino Nano-based logic gate integrated circuit tester.
2) The tester uses an Arduino Nano microcontroller to process inputs and outputs of logic gates and display results on an LCD. It can test ICs with 14 pins.
3) The research aims to design hardware and software for the tester to efficiently test and identify faults in logic gates, making circuit testing more accessible.
1) The document presents a method for accelerating circuit testing and fault detection using an Arduino Nano-based logic gate integrated circuit tester.
2) The tester uses an Arduino Nano microcontroller to process inputs and outputs of logic gates and display results on an LCD. It can test ICs with 14 pins.
3) The research aims to design hardware and software for the tester to efficiently test and identify faults in logic gates, making circuit testing more accessible.
Department of Engineering Education Department of Engineering Education Electrical Engineering Program Electrical Engineering Program Purok 4-B, Apokon, Tagum City, Davao Del Norte Purok 11 Caimito, Brgy. Tagnanan Mabini, Davao de Oro [email protected][email protected]
Kyle Genesis Longos Tessa Loniah Tanamal
Department of Engineering Education Department of Engineering Education Electrical Engineering Program Electrical Engineering Program Rattan, Apokon Tagum City Davao del Norte Purok Aguinaldo, Langgam, Maco Davao de Oro [email protected][email protected]
solutions. This research aims to leverage the capabilities of
Abstract— This paper presents a method for accelerating the Arduino Nano to create an integrated circuit tester circuit testing and fault detection through an Arduino Nano- specifically designed for logic gates. The proposed Arduino based logic gate integrated circuit tester. The Logic gate Nano-based logic gates integrated circuit tester offers several integrated circuit tester is created using a microcontroller, the advantages over existing approaches. Firstly, it provides a Arduino Nano. The microcontroller processes the inputs and cost-effective solution, as the Arduino Nano is an affordable outputs and displays the results on a liquid crystal display and widely available microcontroller board. Secondly, it (LCD). The main function of the Arduino Nano-based logic offers portability, allowing users to carry out testing and fault gates is to test and analyze integrated circuits (ICs). This detection on the go. Additionally, the flexibility of the prototype device can test ICs with 14 pins. Only the required IC gates can potentially be examined. The IC's inputs are provided Arduino Nano enables easy integration with various types of with the correct data, and this device monitors the outputs at logic gates and compatibility with different IC technologies. each step and compares them to the outputs in the truth table. The research will focus on designing a hardware interface Any variation in the IC's operations will provide an error that can connect logic gates to the Arduino Nano, enabling indicator that will display the failed and successful gates on the the measurement of input and output voltages, as well as the LCD. A switch button on the printed circuit board (PCB) is used detection of logical states. to conduct the testing. The 74 series of digital ICs, which are only the basic and universal gates, were selected for the test. Furthermore, software algorithms will be developed to automate the testing process and identify faults or malfunctions within the tested logic gates. The Arduino Keywords— Arduino Nano-based IC tester, Arduino Nano, Nano's processing capabilities and programmability will be LCD, Switch button, 74 series, Gates leveraged to perform these tasks efficiently. The research will I. INTRODUCTION also address the scalability of the proposed solution by exploring the possibility of expanding the circuit tester to accommodate more complex circuits. Additionally, the Digital integrated circuits (ICs) are fundamental building development of a user-friendly graphical interface for blocks in modern electronics, powering a wide range of configuring and controlling the testing process will be devices and systems [1]. In the field of electronics and digital considered to enhance usability. circuitry, testing and fault detection play a crucial role in ensuring the reliability and functionality of integrated circuits (ICs). As the complexity of circuits continues to increase, the By developing an Arduino Nano-based logic gates need for efficient and accurate testing methodologies integrated circuit tester, this research aims to accelerate the becomes more apparent. One of the fundamental components testing and fault detection process in digital circuit design and of digital circuits is logic gates, which are responsible for manufacturing. The affordability, portability, and flexibility performing logical operations. Therefore, the ability to test offered by this solution have the potential to make circuit and validate logic gates is vital in the circuit design and testing more accessible to a broader range of users, including manufacturing process. hobbyists, students, and professionals. Ultimately, this research strives to contribute to the advancement of digital electronics by facilitating the efficient development and Traditional methods of testing logic gates involve the use validation of logic gates. of expensive and specialized equipment, making it inaccessible for hobbyists and students. However, the advent of microcontrollers, such as the Arduino Nano, has opened new possibilities for developing low-cost and portable testing II. REVIEW RELATED LITERATURE results of these errors in output have led to incorrect evaluation and analysis. In a rapidly evolving era, time and This section briefly describes a literature overview of the resources are of paramount importance. And it is no longer Logic gates Integrated Circuit Tester. possible to keep wasting so much time and resources searching for silly problems that occur because of defective ICs. To this end, a low-cost, easy-to-maintain and user- The core elements of any electronic circuit used today are integrated circuits, or ICs, as they are more frequently called. friendly digital IC tester needs to be developed [1]. Despite being one of the most crucial and critical components of the circuit, these ICs are most likely to be the reason for As researchers for the Arduino Nano-based Logic Gates the whole design's malfunction. In addition, it is tedious and Integrated Circuit Tester, our aim is to develop a novel and difficult to troubleshoot the entire circuit only to discover that efficient system that accelerates circuit testing and enhances the problem was either in the design of the circuit or a fault detection in logic gate integrated circuits (ICs). The defective IC. A logic gates integrated circuit tester has been Arduino Nano-based tester will serve as a valuable tool for designed to replace the laborious, complex procedures of electronics engineers, hobbyists, and professionals, providing testing and circuit debugging since it is crucial to test the IC them with a user-friendly and cost-effective solution for before using it in any applications. testing and verifying the functionality of various logic gates. Our research aims to contribute significantly to the field of electronics testing and fault detection, empowering On microcontroller-based IC tester designs, several engineers, and enthusiasts with a valuable tool for their digital studies and research have been conducted. Some of the circuit projects and troubleshooting tasks. The Arduino studies that served as inspiration for this project [2]. Nano-based Logic Gates Integrated Circuit Tester has the potential to accelerate development, enhance quality control, A study work by Yeh et al. [3] the development rate of and reduce time and resources in various electronics manufacturing technology differs from the testing applications. capabilities of the tester. Strict quality control is necessary to ensure the reliability of critical electronic products by removing all defective parts from the total number of parts. III. METHODOLOGY However, because testing technology is still developing slowly, it is getting harder and harder to choose highly This section aims to provide a step-by-step guide for reliable electronic products using the technology that is designing, implementing, and evaluating the Arduino Nano- currently available. As a result, the suppliers must suggest based circuit tester. effective solutions to this issue. A. Prototype Design The challenge of IC testing, which requires effective solutions with reliable performance, has now become a The prototype was created using a printed circuit board critical problem for the global semiconductor industry [4]. It (PCB), which is used for both the creation of permanently is necessary to ensure that these components are functional, soldered circuits and for electronics prototyping. since most of the components on the market do not guarantee or can be destroyed after being used, to introduce a design The suggested system's flow diagram may be seen in the and connect an electronic component into any planned accompanying Fig. 1. Upon system initialization, the system system. There shall be a device for easy verification of these is automatically reset, and an initializing message, such as components; also, some parts require specialized testing "IC TESTER DATABASE 2023," is displayed on the LCD. circuits, and the program should be written and uploaded to The IC that will be examined is inserted into the ZIF socket. the microcontroller to determine whether it is functioning or The IC is inserted into the socket and shown on a 16x2 LCD not [5]. This is why we are thinking about how to develop a screen as well. By pushing a switch button, the circuit must concept that can provide solutions for all these problems at a be test or reset. Reset the push button if the notice "No IC lower cost and with attainable components. found" is displayed if the IC is accidentally inserted incorrectly or malfunctioning. When an IC is entered, the Another researcher, Darji [2], has done a research project Arduino board sends a database to the EEPROM to determine that aims to develop a digital IC test tool that is less costly if it is good or bad. "IC: NUMBER_GATE STATUS: and more useful than current market options. The goal is to GOOD" is displayed if the IC is in good condition. quickly check ICs and evaluate their logic functioning using input conditions and a truth table. The test will display good and bad ICs on the LCD using the basic logic gate IC series. The tool is cost-effective, portable, simple to use, and reconfigurable, making it a valuable addition to the market.
Generally, before the ICs can be used for research and
development purposes, it is very important to ensure that they are tested. The malfunctioning ICs produce results that are inappropriate and unpredictable for the tasks at hand. The Fig 3: Circuit Connection
Fig.1. System flowchart
Fig. 2 depicts the block diagram for the IC tester design's
component parts. The "Reset" and "Test" functions are controlled by the switch button function. The microcontroller will load the database into the EEPROM through the programmer mode loaded in the microcontroller. IC testing can be done by inserting the IC in the ZIF socket with proper terminal placement. The result will be sent back to the microcontroller to check and verify the results through the truth table loaded in the EEPROM and prompt the result on the I2C LCD display.
Fig 4: PCB Design
B. Hardware Description
Based on the proposed design of the Arduino Nano-based
Logic Gates Integrated Circuit Tester, the following materials Fig.2. Block diagram of components will be used. Alternative materials for carrying out the design are listed below. The following is a list of hardware materials, Below, Fig.3 and Fig.4 shows overall circuit connection along with a brief description of each material. and PCB design for the Arduino Nano-based Logic IC tester. This logic IC tester is powered by a 5-volt DC. The main Component Image Description power switch, which controls the circuit's power, may be Name turned on or off. The circuit's brain is a microcontroller called an Arduino Nano. It managed the LCD, the ZIF socket, and command send and receive. When either a microcontroller Arduino Small, complete, and malfunctions or the incorrect IC is inserted by the user doing Nano breadboard-friendly IC testing, the reset button is required to reset the board based on the ATmega328 (Arduino microcontrollers. Nano 3.0) or ATmega168 (Arduino Nano 2.x). GPIO: 14, RAM: 1 KB (ATmega168) or 2 KB (ATmega328), Operating Voltage: 5V EEPROM High Reliability, compressive AT24C512 Low-voltage, and properties, and is Standard-voltage widely used in Operation: 2.7 (VCC electronics. = 2.7V to 5.5V) 1.8 PCB A self-contained (VCC = 1.8V to 3.6V), module of Internally Organized interconnected 65,536 x 8, Two-wire electronic Serial Interface, 512K components found in SERIAL EEPROM, devices. It is used to 16-bit data word connect electronic address components using Resistor A passive component conductive tracks with a specified pads and other resistance value. features etched from copper sheets I2C Compatible with laminated onto a non- interface Arduino Board or conductive substrate. 16x2 LCD other controller Switch A mechanical device board with I2C bus, button used to control an Display Type: electrical circuit in Negative white on which the operator blue backlight, Supply manually presses a voltage: 5V, button to actuate an Interface: I2C to 4bits internal switching LCD data and control mechanism. lines, Board Size: 80x36 mm Table 1. Hardware Materials ZIF socket A type of electrical connector that requires very little to C. Software Design no force for insertion. This is often used In the process of designing software, the software's when there is a need implementation was initially chosen to efficiently develop the to program or test the system's program source code. The prototype's software was chip without implemented using the CC+ language. The operating process damaging it. This 16- was decided upon after the software had been created and pin ZIF IC Test Socket placed into the microcontroller to examine how the entire can be used with any system operated as a whole. When the prototype had been 16-pin DIP- completed, it was put to the test to gather data and determine programmable IC. whether it was completely functioning. To make judgments, Jump wires An electrical wire or a the acquired data was examined. group of them in a cable with a connector or pin at each end, which is normally used to interconnect the components of a breadboard or other prototype or test circuit, internally or with other equipment or components, Fig.5. Arduino IDE without soldering. Plastic This enclosure enclosure secures both wired Arduino IDE is an open-source programming tool that structured wiring has been mostly used to write and compile code for the systems and wireless Arduino module. This program is an official source for networking Arduino. Each of these contains a microcontroller that can be equipment, is free programmed and used to take data in the form of code. Once from corrosion, has the primary code has been written on the IDE platform, which Above in Fig. 8. is the conceptual framework diagram of is often referred to as a sketch, the Hex File will be sent to the machine. The user uploads an image to the Inkscape and uploaded to the controller on the board. The two most template and reduces the size to match the size of the important components of the IDE environment are an editor template’s border in Fig. 3. The image is then saved as a G- and a compiler. Writing the required code is done with an code. The G-code is uploaded to the processing software, editor, while creating and uploading codes to a specific communicates with the Arduino microcontroller, and prints Arduino module is done by using your Compiler. In this the outline of the image. environment, both C and C++ languages are supported [6] IV. RESULTS AND DISCUSSION
The Arduino Nano-based Logic Gates IC Tester project
ran efficiently after we created the programs for the microcontroller and the graphical user interface (EasyEDA). We can see all the display messages, such as "IC TESTER DATABASE 2023" and verifying the IC gate number, as well as the message of the IC being faulty or good, in the results of the built-in system that shows the matching results on the LCD and on the serial monitor of the Arduino IDE.
Fig.6. EasyEDA
EasyEDA is a free, no-installation, cloud-based electronic
computer-aided design (ECAD) network designed to provide engineers, educators, engineering students, and amateur radio listeners with an easy tool that does not require installation. The schematic editor, circuit simulator, and PCB design system are simple-to-use tools that can be used in any browser [7]
D. Theoretical and Conceptual Framework
Fig. 7. Theoretical Framework of the Arduino Nano-
based Logic Gates Integrated Circuit Tester Fig. 9. The Logic Gates Integrated Circuit Tester using an Arduino Nano is shown from the front. Shown in Fig. 7 is the theoretical framework for the design of the Arduino Nano-based Logic Gates Integrated The figure above illustrates the hardware of the Arduino Circuit Tester. An IC is inserted to the ZIF socket, Nano-based Logic Gates Integrated Circuit Tester. microprocessor send the database to the EEPROM, processes the database, and prompts the result on a Liquid Crystal Display. The diagram's simplicity appeals to both novices and those who build their own device.
Figure 10. Display message on LCD.
Fig. 10. above shows that on turning on the system.
Fig. 8. Conceptual Framework of the Arduino Nano- based Logic Gates Integrated Circuit Tester V. CONCLUSION
Our research demonstrates that an Arduino Nano-based
integrated circuit tester is an efficient and accessible tool for accelerating circuit testing and fault detection. By leveraging the capabilities of the Arduino Nano, we were able to reduce testing time and enhance the accuracy of our tests. This research opens new possibilities for cost-effective and faster testing methods in the electronics industry.
The Arduino Nano-based logic gate IC tester tests the ICs
being placed in the ZIF socket and gives results about whether the ICs are good or faulty. The model is user-friendly and easy to use and maintain. It reduces time to test an IC as we are testing it automatically compared to manually testing, where various connections and applications of inputs are done. The code is reconfigurable. If any further changes are required according to the needs of the user, they can be made very easily. It saves lots of time and resources and is thus economically efficient. Fig. 11. Entered IC for testing. VI. REFERENCES Fig. 11. shows that after a short delay, the system asks the user to enter the IC number that is inserted into the ZIF [1] P. D. G. Kanade, N. Zambare, and K. Rathode, “Digital socket. message displayed on LCD screen. IC Tester using Arduino.” 2019, [Online]. Available: www.ijtrd.com
[2] C. Darji, “DESIGN AND IMPLEMENTATION OF
MICROCONTROLLER BASED DIGITAL LOGIC GATE IC TESTER,” 2021, doi: 10.13140/RG.2.2.36066.25288/1.
[3] C. H. Yeh, J. E. Chen, C. J. Chang, and T. C. Huang,
“Using Enhanced Test Systems Based on Digital IC Test Figure 12: Checking in database for IC testing. Model for the Improvement of Test Yield,” Electronics (Switzerland), vol. 11, no. 7, Apr. 2022, doi: Figure 12 shows that, quad 2 input OR gate 74LS32 IC 10.3390/electronics11071115. is inserted into the ZIF socket, its corresponding number as defined in code i.e. 7432 was entered through keypad. As [4] Sapkota K., Chaudhary K. K., Paudel R. P., Karki J., soon as system receives the IC number, it immediately “ELECTRONICS TESTER” 2018 performs the tests with the IC being mounted with its corresponding truth table that is stored in database which is [5] O. M. Alfroukh, E. Elayan, A. Gharbyeh, and E. W. again created using arduino coding. Takrouri, “Team Member: Supervisor: Co-Supervisor,” 2021.
[6] M. Fezari and A. Al Dahoud, “Integrated Development
Environment ‘IDE’ For Arduino Integrated Development Environment ‘IDE’ For Arduino Introduction to Arduino IDE,” 2018. [Online]. Available: Figure 13: IC is good. https://www.researchgate.net/publication/328615543
[7] V. K. Abdrakhmanov, R. B. Salikhov, and S. A. Popov,
“Experience of using EasyEDA to develop training boards on the PIC16f887 microcontroller,” in Journal of Physics: Conference Series, IOP Publishing Ltd, Nov. 2021. doi: Figure 14: IC is faulty. 10.1088/1742-6596/2096/1/012098.\
Figure 13 and 14 shows that the IC is good/faulty after
comparing the tests carried on IC and the actual truth table.