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走査電子顕微鏡基本用語集
  走査電子顕微鏡に関する、理論や装置、観察手法などについて解説しています。 提供 JEOL URL http://www.jeol.co.jp/ |
走査電子顕微鏡基本用語集 のさくいん
「C」から始まる用語のさくいん
- calibration-curve method
- carbon coater
- carbon deposition
- carbon film
- carbon paste
- carbon rod
- carbon supporting film
- carbon tape
- casting method
- cathode
- cathode lens
- cathode ray tube
- cathodoluminescence
- cathodoluminescence spectrometer
- CD-SEM
- CFE electron gun
- CFE電子銃
- channeling
- channeling contrast
- characteristic X-ray
- charge balance
- charging
- charging phenomenon
- chemical digestion method
- chemical etching
- chemical fixation
- chemical polishing
- chemical state analysis
- chemical-mechanical polishing
- chip noise
- chromatic aberration
- circle of least confusion
- CL
- cleavage
- cleaving
- Cliff-Lorimer correction
- CMP
- coating
- cold stage
- cold trap
- cold-field-emission electron gun
- collector
- collimator
- colloid-SEM method
- colloidal gold
- color fluorescence SEM
- column
- compositional contrast
- compositional image
- compositional image in BE mode
- compositional image in BSE mode
- condenser lens
- conductive paste
- conductive staining
- conductive tape
- conductive treatment
- contamination
- continuous X-ray
- contrast
- contrast enhancement
- conventional FESEM
- conventional objective lens
- conventional SEM
- cool stage
- cooling stage
- counting rate
- CP
- critical dimension SEM
- critical-point drying
- Cross Section Polisher
- cross-sectional observation
- cross-sectional scanning electron microscopy
- crossover
- CRT
- CRT for observation
- CRT for photographing
- cryo stage
- cryo-SEM
- cryoprotectant
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