Projects/Programs

Displaying 1 - 25 of 257

Absolute cryogenic infrared radiometry at the LBIR facility

Ongoing

The Strategic Defense Initiative (SDI), and subsequently the Ballistic Missile Defense Organization (BMDO) and the Missile Defense Agency (MDA) of the U.S. Department of Defense (DoD), have motivated NIST's work developing calibration methods and standards for space-based sensors used in missile

Accurate Cure Kinetics, Stress, Mechanical Properties and Warpage

Ongoing

Advanced packaging involves increasingly challenging requirements for heterogeneous integration and chiplet packaging. Needs such as fine pitch interconnects

AC-DC Difference

Ongoing

The use of thermal converters for ac voltage metrology was introduced by Frank Hermach at NIST in 1952. The basic thermal converter is a thermoelement, consisting of a thermocouple positioned at the midpoint of a heater wire, enclosed in an evacuated bulb. The thermoelement senses the heat generated

Acoustic Techniques in Fluid Metrology

Ongoing

In collaboration with NIST's Chemical Sciences Division, we use photoacoustic resonators for continuous monitoring of the CO2 concentration in ambient air from a tall building rooftop; (see Fig. 2) [ 1] for measuring the optical properties of particles (e.g. soot) in air that affect the energy

Photograph of a labeled amber bottle containing SRM 2429.

Activated Carbon and FGD Gypsum Standard Reference Materials

Completed

The role of mercury in the environment is now receiving close scrutiny because ultimately it can bioaccumulate as alkyl mercury in seafood with subsequent risk to human health through trophic transfer. Many industrial sources of mercury have been effectively reduced in recent years, but atmospheric

Advanced Analytical Electron Tomography for Materials Development and Failure Analysis in Semiconductor Devices

Ongoing

Conventional TEM imaging was sufficient for decades in the semiconductor industry, but its utility is declining as device designs become more complex and as feature sizes continue to shrink. Conventional imaging modes are challenged by the small, complex structures which are vital to current and

Advanced Composites Pilot for the Materials Genome Initiative

Completed

Many computational programs exist that are being used by industry for predicting properties of polymer composites but their general predictive power is limited by how faithfully the microstructure is represented and how realistically the interfaces are handled. The computations are limited by the

Advanced Mass Spectrometry Methods for Trace Detection

Ongoing

Ambient Ionization Mass Spectrometry (AI-MS) AI-MS remains a versatile field enabling direct analysis of samples in situ, requiring minimal or no sample preparation. These platforms are leveraged for the trace detection of organic and inorganic compounds, including, homemade and improvised

Advanced Materials: Elemental and Chemical Analysis of Microstructured Materials

Ongoing

Projects: DTSA-II – Pushing the Limits of Energy Dispersive X-ray Spectrometry Multimodal Superresolution Microscopy Forensic Trace Evidence

Advanced Materials Metrology

Ongoing

Electromagnetic devices cannot operate without the interaction of electromagnetic waves with materials, and the characterization of the interface between fields and materials will be a critical task for any device or metrology development from nanoscale to larger scales. Areas of impact over the

Advanced Metering in Smart Distribution Grids

Completed

Objective: To advance measurement science for the performance of smart meters and associated metering standards and test procedures that will enable accurate and fair electricity metering needed for the smart grid, by 2016. What is the new technical idea? This project will develop test procedures

Advanced Metrology to Enable Next Generation EUV Photoresists

Ongoing

EUV (extreme ultraviolet) lithography, the technology that “saved Moore’s Law,” is widely regarded as the future of cutting-edge nanofabrication. It was developed in the United States and U.S. companies in many parts of the EUV ecosystem have established dominance in the field that must be defended

Advanced Microscopy for Trace and Bulk Particle Characterization

Ongoing

The goal of this project is to help develop innovative metrologies and measurement protocols for micro/nano-scale analysis of particles. In this project, state-of-the-art optical and electron-based microscopy are used to conduct research for quantitative and qualitative analysis of chemical

Advancing PEEM-based Metrology

Ongoing

With the rise of emergent material systems, nanoscale devices and components, there is a need to assess their electronic properties at similar length scales. Bulk-sensitive measurements provide characteristic information averaged over the sample or device, and these properties may not be uniform

Advancing Power Electronics with Defect Metrology

Ongoing

Power electronics play a central role in all aspects of electrical energy storage, distribution, conversion, and consumption. Currently, power electronics heavily rely on Si-based insulated-gate bipolar transistors (IGBT), which have large footprints, are inefficient, and require extensive cooling

Aerodynamic Flow Visualization

Ongoing

Other videos: How Well Do Masks Work? (Schlieren Imaging In Slow Motion!) 3 Ways Of Seeing Invisible Air Flow (Veritasium) The Air You Share | All in This Together Publications "Filter Inserts Impact Cloth Mask Performance against Nano- to Micro-Sized Particles" James G. Radney, Jamie L. Weaver

Ambient and Atmospheric Pressure Mass Spectrometry

Ongoing

Surface and Trace Chemical Analysis Group employs a range of commercial pneumatically-assisted electrospray ionization (ESI), atmospheric pressure chemical ionization (APCI), and atmospheric pressure photoionization (APPI) sources for traditional mass spectrometric chemical analysis, identification

Analysis and Modeling of Atmospheric Particles to Assess Effects on Climate

Ongoing

Spectral data from satellite and ground-based remote sensing instruments are used to monitor the effects of atmospheric aerosols on climate. Determinations of how aerosols interact with sunlight or infrared radiation from Earth’s surface rely upon an aerosol model that approximates the sizes, shapes

Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

Ongoing

Atom probe tomography (APT) is a unique analytical tool capable of providing 3D atomic maps of any element in the periodic table with sub-nm spatial resolution and high analytical sensitivity (in the ppm range, in some cases). APT is currently employed by many of the largest semiconductor

Atomistic Potentials and the Future of Nanomaterials Metrology

Ongoing

Atomistic simulations are increasingly being used as a tool to understand and predict properties of materials in systems, such as nanomaterials, where direct measurement is time-consuming or extremely difficult. The success of atomistic simulations depends critically on the fidelity of a specific

Audit of EPA Protocol Gas Suppliers

Ongoing

Protocol gas standards are employed in measurements made for compliance purposes; one of the major uses is for measurements of regulated gaseous species from stationary source emitters, i.e., stack gases. Many of these stationary sources are regulated through the Cap and Trade program; therefore

Augmented Intelligence for Manufacturing Systems (AIMS)

Ongoing

Objective To overcome existing measurement challenges via augmented intelligence, the fusion of integrated metrology, physics-based models, and artificial intelligence, to enable monitoring, diagnostics, and prognostics of manufacturing systems and their processes. Technical Idea One research

$Autonomous materials metrology diffraction measurement performed at SLAC$

Autonomous Systems for Materials Research and Metrology: Accelerating Discovery and Democratizing Science

Ongoing

Materials scientists often need to search high dimensional spaces for knowledge. For example, a scientist may be interested in learning how a material property (e.g. hardness) changes over many (for example, 10) values of a synthesis or processing parameter (e.g., annealing temperature). Such an

Building the next generation reference reflectometer

Ongoing

Have you ever wondered why some objects appear glossy, and others diffuse? Or thought about the complexity of characterizing the way light reflects from an object under different illumination and viewing angles and at different wavelengths in order to realistically render it in a computer simulation

Calibration Services: National Air-Kerma Standard for Electronic Brachytherapy

Ongoing

The increased use of limited-lifetime electronic brachytherapy sources which are miniature, low-energy x-ray tubes for clinical applications resulted in the need of a measurement of air-kerma dose from NIST. The type of electronic brachytherapy sources, Axxent S700, used at NIST operates at tube

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