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Metrology

Dimensional metrology

News and Updates

artifact

Back to the Future: Gear Edition

As mechanical objects, gears have been around for so long that people may take them for granted. But gears are sophisticated parts that play a vital role in

Projects and Programs

Prototype NIST developed Next-Gen fiber probe for inspection of small critical features.

Dimensional Measurement Services

Ongoing
The Dimensional Measurement Services project promotes manufacturing innovation and U.S. industrial competitiveness by providing critical technology-enabling high accuracy dimensional measurements within an internationally accepted quality system. These measurements span the dimensional metrology

Material Qualification

Ongoing
Objective To develop, utilize, and analyze methods of characterizing the precursor materials in additive manufacturing in both virgin and recycled states with the goal of advancing measurement science to benefit the AM community. The components of principal interest will include the rheological

Precursor Material Qualification

Completed
To develop, utilize, and analyze methods of characterizing the precursor materials in additive manufacturing in both virgin and recycled states with the goal of advancing measurement science to benefit the AM community. The components of principal interest will include the rheological, size
Laser tracker calibration in Tape Tunnel Facility

Advanced Dimensional Measurement Systems

Ongoing
New dimensional measurement technologies provide significant benefits to industry such as increasing measurement throughput, enabling new manufacturing process (such as additive manufacturing) and providing more detailed part information for manufacturing process improvement. However, before

Publications

Tools and Instruments

Laser Doppler Vibrometer located in 218/D012 (Group 643.09)

Laser Doppler Vibrometer Microscope

Since 2006, the Nanomechanical Properties Group has pioneered the use of Laser Doppler Vibrometry (LDV) to calibrate the stiffness of AFM cantilevers using the
Examples of work in the Precision Imaging Facility.  (a) STEM image of a crack (dislocation) formed during growth of an AlGaN shell around a GaN nanowire, and (b) FIB fabrication of an AFM tip with a GaN nanowire contact point.

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the